Title

Thermal Anisotropy in Nano-Crystalline MoS2 Thin Films

Author(s)

Christopher Muratore, University of DaytonFollow
Vikas Varshney, Air Force Research Laboratory
Jaime J. Gengler, Air Force Research Laboratory
Jianjun Hu, University of DaytonFollow
John E. Bultman, University of DaytonFollow
Ajit K. Roy, Air Force Research Laboratory
Barry L. Farmer, Air Force Research Laboratory
Andrey A. Voevodin, Air Force Research Laboratory

Document Type

Article

Publication Date

2014

Publication Source

Physical Chemistry Chemical Physics

Abstract

In this work, we grow thin MoS₂ films (50–150 nm) uniformly over large areas (>1 cm²) with strong basal plane (002) or edge plane (100) orientations to characterize thermal anisotropy. Measurement results are correlated with molecular dynamics simulations of thermal transport for perfect and defective MoS₂ crystals. The correlation between predicted (simulations) and measured (experimental) thermal conductivity are attributed to factors such as crystalline domain orientation and size, thereby demonstrating the importance of thermal boundary scattering in limiting thermal conductivity in nano-crystalline MoS₂ thin films. Furthermore, we demonstrate that the cross-plane thermal conductivity of the films is strongly impacted by exposure to ambient humidity.

Inclusive pages

1008-1014

ISBN/ISSN

1463-9076

Publisher

Royal Society of Chemistry

Volume

16

Peer Reviewed

yes

eCommons Citation

Muratore, Christopher; Varshney, Vikas; Gengler, Jaime J.; Hu, Jianjun; Bultman, John E.; Roy, Ajit K.; Farmer, Barry L.; and Voevodin, Andrey A., "Thermal Anisotropy in Nano-Crystalline MoS2 Thin Films" (2014). Chemical and Materials Engineering Faculty Publications. 101.
https://ecommons.udayton.edu/cme_fac_pub/101