Examination of Focal Shifts of Modified Gaussian Beams Under External Lensing

Author(s)

Partha P. Banerjee, University of DaytonFollow
Chin-Ru Lin, ZyXEL Communication Corporation
Monish Ranjan Chatterjee, University of DaytonFollow

Document Type

Article

Publication Date

1995

Publication Source

Journal of Modern Optics

Abstract

Beam profiles, belonging to a class of modified Gaussians, are subjected to external lensing, and the focal shifts are computed. The results are verified using a numerical technique based on a Fourier transform approach to diffraction. The method can be readily extended to the study of the external characteristics of other classes of non-Gaussians, including the flat-top and super-Gaussian profiles.

Inclusive pages

955-964

ISBN/ISSN

0950-0340

Comments

Permission documentation is on file.

Copyright

Copyright © 1995, Taylor and Francis

Publisher

Taylor and Francis

Volume

42

Peer Reviewed

yes

Issue

5

eCommons Citation

Banerjee, Partha P.; Lin, Chin-Ru; and Chatterjee, Monish Ranjan, "Examination of Focal Shifts of Modified Gaussian Beams Under External Lensing" (1995). Electrical and Computer Engineering Faculty Publications. 180.
https://ecommons.udayton.edu/ece_fac_pub/180