Title

A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies

Document Type

Article

Publication Date

2007

Publication Source

Ferroelectrics

Abstract

Read More: http://www.worldscientific.com/doi/abs/10.1142/S179329200900154X

Inclusive pages

153-157

ISBN/ISSN

0015-0193

Publisher

Taylor & Francis Group

Volume

356

Issue

1

Peer Reviewed

yes

Keywords

Varactor shunt switches, capacitive test structure, microwave characterization of ferroelectric thin films