Intrinsic Physical Layer Authentication of Integrated Circuits

Author(s)

William E. Cobb, Air Force Institute of Technology
Eric D. Laspe, Air Force Institute of Technology
Rusty O. Baldwin, University of DaytonFollow
Michael A. Temple, Air Force Institute of Technology
Yong C. Kim, Air Force Institute of Technology

Document Type

Article

Publication Date

2-2012

Publication Source

IEEE Transactions on Information Forensics and Security

Abstract

Radio-frequency distinct native attribute (RF-DNA) fingerprinting is adapted as a physical-layer technique to improve the security of integrated circuit (IC)-based multifactor authentication systems. Device recognition tasks (both identification and verification) are accomplished by passively monitoring and exploiting the intrinsic features of an IC's unintentional RF emissions without requiring any modification to the device being analyzed. Device discrimination is achieved using RF-DNA fingerprints comprised of higher order statistical features based on instantaneous amplitude, phase, and frequency responses as a device executes a sequence of operations. The recognition system is trained using multiple discriminant analysis to reduce data dimensionality while retaining class separability, and the resultant fingerprints are classified using a linear Bayesian classifier. Demonstrated identification and verification performance includes average identification accuracy of greater than 99.5% and equal error rates of less than 0.05% for 40 near-identical devices. Depending on the level of required classification accuracy, RF-DNA fingerprint-based authentication is well-suited for implementation as a countermeasure to device cloning, and is promising for use in a wide variety of related security problems.

Inclusive pages

14 - 24

ISBN/ISSN

1556-6013

Comments

Permission documentation on file.

Copyright

Copyright © 2012, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Publisher

Institute of Electrical and Electronics Engineers

Volume

7

Peer Reviewed

yes

Issue

1

eCommons Citation

Cobb, William E.; Laspe, Eric D.; Baldwin, Rusty O.; Temple, Michael A.; and Kim, Yong C., "Intrinsic Physical Layer Authentication of Integrated Circuits" (2012). Computer Science Faculty Publications. 111.
https://ecommons.udayton.edu/cps_fac_pub/111