Physical Review A
We discuss propagation effects in realistic, transparent, metallodielectric photonic band gap structures in the context of negative refraction and super-resolution in the visible and near infrared ranges. In the resonance tunneling regime, we find that for transverse-magnetic incident polarization, field localization effects contribute to a waveguiding phenomenon that makes it possible for the light to remain confined within a small fraction of a wavelength, without any transverse boundaries, due to the suppression of diffraction. This effect is related to negative refraction of the Poynting vector inside each metal layer, balanced by normal refraction inside the adjacent dielectric layer: The degree of field localization and material dispersion together determine the total momentum that resides within any given layer, and thus the direction of energy flow. We find that the transport of evanescent wave vectors is mediated by the excitation of quasistationary, low group velocity surface waves responsible for relatively large losses.
As representative examples we consider transparent metallodielectric stacks such as Ag∕TiO2 and Ag∕GaP and show in detail how to obtain the optimum conditions for high transmittance of both propagating and evanescent modes for super-guiding and super-resolution applications across the visible and near IR ranges.
Finally, we study the influence of gain on super-resolution. We find that the introduction of gain can compensate the losses caused by the excitation of surface plasmons, improves the resolving characteristics of the lens, and leads to gain-tunable super-resolution.
033848-1 to 033848-12
Copyright © 2008, American Physical Society
American Physical Society
de Ceglia, Domenico; Vincenti, Maria Antonietta; Cappeddu, M. G.; Centini, Marco; Akozbek, Neset; D'Orazio, Antonella; Haus, Joseph W.; Bloemer, Mark J.; and Scalora, Michael, "Tailoring Metallodielectric Structures for Superresolution and Superguiding Applications in the Visible and Near-IR Ranges" (2008). Electrical and Computer Engineering Faculty Publications. 288.
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