Title

Image Sharpness and Beam Focus VLSI Sensors for Adaptive Optics

Document Type

Article

Publication Date

12-2002

Publication Source

IEEE Sensors Journal

Abstract

High-resolution wavefront control for adaptive optics requires accurate sensing of a measure of optical quality. We present two analog very-large-scale-integration (VLSI) image-plane sensors that supply real-time metrics of image and beam quality, for applications in imaging and line-of-sight laser communication. The image metric VLSI sensor quantifies sharpness of the received image in terms of average rectified spatial gradients. The beam metric VLSI sensor returns first and second order spatial moments of the received laser beam to quantify centroid and width. Closed-loop wavefront control of a laser beam through turbulence is demonstrated using a spatial phase modulator and analog VLSI controller that performs stochastic parallel gradient descent of the beam width metric.

Inclusive pages

680–690

ISBN/ISSN

1530-437X

Comments

Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Permission documentation on file.

Publisher

Institute of Electrical and Electronics Engineers

Volume

2

Issue

6

Peer Reviewed

yes

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