Date of Award
2002
Degree Name
M.S. in Electro-Optics
Department
Department of Electro-Optics and Photonics
Keywords
Raman spectroscopy Construction and design, Microprobe analysis, Strains and stresses Measurement, Silicon carbide, Silicon
Rights Statement
Copyright © 2002, author
Recommended Citation
Reyerson, Christian S., "Development of the imaging capabilities of a Raman microprobe for residual surface stress measurement of silicon and silicon carbide" (2002). Graduate Theses and Dissertations. 5145.
https://ecommons.udayton.edu/graduate_theses/5145
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