Illumination Recovery For Optical Microscopy

Date of Award


Degree Name

M.S. in Electrical Engineering


Department of Electrical and Computer Engineering


Advisor: Keigo Hirakawa


We propose a novel solution to the correction of illumination non-uniformity without removing the imaging sample.Calibration of the spatial illumination pattern in microscopy is challenging due to the fact that the illumination source is colocated with the objective lens and therefore cannot be observed directly. Our proposed methodology overcomes this by collecting three spatially translated images in a strategic way. We prove that ``log-illumination pattern'' recovery can be reformulated as a deconvolution of log-ratio of captured images, and develop an efficient, noise-robust implementation. Experiments with simulated and reflectance microscopy data verifies the effectiveness of our proposed approach.


Electrical Engineering, Scientific Imaging, Non-uniformity correction, Microscopy, Signal Processing, Image Processing, Signal Recovery

Rights Statement

Copyright © 2020, author