Document Type
Article
Publication Date
11-1995
Publication Source
Optical Engineering
Abstract
We introduce and analyze techniques for the reduction of aliased signal energy in a staring infrared imaging system. A standard staring system uses a fixed two-dimensional detector array that corresponds to a fixed spatial sampling frequency determined by the detector pitch or spacing. Aliasing will occur when sampling a scene containing spatial frequencies exceeding half the sampling frequency. This aliasing can significantly degrade the image quality. The aliasing reduction schemes presented here, referred to as microscanning, exploit subpixel shifts between time frames of an image sequence. These multiple images are used to reconstruct a single frame with reduced aliasing. If the shifts are controlled, using a mirror or beam steerer for example, one can obtain a uniformly sampled microscanned image. The reconstruction in this case can be accomplished by a straightforward interlacing of the time frames. If the shifts are uncontrolled, the effective sampling may be nonuniform and reconstruction becomes more complex. A sampling model is developed and the aliased signal energy is analyzed for the microscanning techniques. Finally, a number of experimental results are presented that illustrate the perlormance of the microscanning methods.
Inclusive pages
3130-3137
ISBN/ISSN
0091-3286
Document Version
Published Version
Copyright
Copyright © 1995, Society of Photo-Optical Instrumentation Engineers (SPIE)
Publisher
Society of Photo-Optical Instrumentation Engineers (SPIE)
Volume
34
Peer Reviewed
yes
Issue
11
Keywords
Microscanning, aliasing, high resolution, subpixel, infrared imaging, motion estimation
eCommons Citation
Gillette, Joseph C.; Stadtmiller, Thomas M.; and Hardie, Russell C., "Aliasing Reduction in Staring Infrared Imagers Utilizing Subpixel Techniques" (1995). Electrical and Computer Engineering Faculty Publications. 11.
https://ecommons.udayton.edu/ece_fac_pub/11
Included in
Computer Engineering Commons, Electrical and Computer Engineering Commons, Instrumentation Commons, Optics Commons, Other Engineering Commons
Comments
Permission documentation is on file.