A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies
Document Type
Article
Publication Date
2007
Publication Source
Ferroelectrics
Abstract
Read More: http://www.worldscientific.com/doi/abs/10.1142/S179329200900154X
Inclusive pages
153-157
ISBN/ISSN
0015-0193
Publisher
Taylor & Francis Group
Volume
356
Peer Reviewed
yes
Issue
1
Keywords
Varactor shunt switches, capacitive test structure, microwave characterization of ferroelectric thin films
eCommons Citation
Subramanyam, Guru, "A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies" (2007). Electrical and Computer Engineering Faculty Publications. 48.
https://ecommons.udayton.edu/ece_fac_pub/48
COinS
