Date of Award
1970
Degree Name
M.S. in Electrical Engineering
Keywords
Electronic circuits Testing, Integrated circuits Testing, Electric fault location
Rights Statement
Copyright © 1970, author
Recommended Citation
Bernhardt, Robert Edward, "Test generation and redundancy isolation for sequential logic circuits" (1970). Graduate Theses and Dissertations. 1520.
https://ecommons.udayton.edu/graduate_theses/1520
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