Date of Award
2000
Degree Name
M.S. in Materials Engineering
Department
Department of Chemical and Materials Engineering
Keywords
Copper Surfaces, Thin films Optical properties, Atomic force microscopy, Scanning probe microscopy, Ultrasonic imaging
Rights Statement
Copyright © 2000, author
Recommended Citation
Schumaker, Edward John, "Ultrasonic force microscopy for materials characterization" (2000). Graduate Theses and Dissertations. 5455.
https://ecommons.udayton.edu/graduate_theses/5455
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