Date of Award
1996
Degree Name
M.S. in Electro-Optics Engineering
Department
Department of Electro-Optics and Photonics
Keywords
Reflectometer, Ellipsometry, Infrared spectroscopy, Thin films Optical properties
Rights Statement
Copyright © 1996, author
Recommended Citation
Thomas, Michael Scott, "Design and performance of an infrared spectroscopic ellipsometerreflectometer for thin-film characterization" (1996). Graduate Theses and Dissertations. 5946.
https://ecommons.udayton.edu/graduate_theses/5946
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