Date of Award
1996
Degree Name
M.S. in Electro-Optics Engineering
Department
Department of Electro-Optics and Photonics
Keywords
Reflectometer, Ellipsometry, Infrared spectroscopy, Thin films Optical properties
Rights Statement
Copyright 1996, author
Recommended Citation
Thomas, Michael Scott, "Design and performance of an infrared spectroscopic ellipsometerreflectometer for thin-film characterization" (1996). Graduate Theses and Dissertations. 5946.
https://ecommons.udayton.edu/graduate_theses/5946
COinS
