Date of Award
2010
Degree Name
Ph.D. in Electro-Optics
Department
Department of Electro-Optics and Photonics
Keywords
Ellipsometry Instruments, Thin films Optical properties
Rights Statement
Copyright © 2010, author
Recommended Citation
Tschimwang, Alain Ngoy, "Building and testing a high spatial resolution nulling microellipsometer using rotational polarization symmetry" (2010). Graduate Theses and Dissertations. 6041.
https://ecommons.udayton.edu/graduate_theses/6041
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