Temperature dependent refractive index measurements for gallium nitride with implications for phase matched and quasi-phase matched optical frequency conversion devices

Temperature dependent refractive index measurements for gallium nitride with implications for phase matched and quasi-phase matched optical frequency conversion devices

Presenter(s)

Jack David Kunkel

Description

Gallium nitride is a valuable material for optical and electronic applications due to its wide band gap and high thermal conductivity. Gallium nitride has the potential for being a valuable material in frequency conversion devices such as frequency doublers and optical parametric oscillators. Optical and mechanical characterization of gallium nitride, including the dependence of the refractive index on wavelength and temperature, is important for predicting the performance of devices using this material. The method of minimum deviation was used to measure the refractive index for wavelengths ranging from 0.400 to 5.20 microns and in temperatures ranging from 20 to 225°C. Results of this characterization will be presented along with calculations relating to phase matching and quasi-phase matching in optical parametric oscillators.

Publication Date

4-18-2018

Project Designation

Independent Research

Primary Advisor

Said Elhamri

Primary Advisor's Department

Physics

Keywords

Stander Symposium project

Temperature dependent refractive index measurements for gallium nitride with implications for phase matched and quasi-phase matched optical frequency conversion devices

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