Perturbational Analysis of Steady-State and Transient-Beam Fanning in Thin and Thick Photorefractive Media

Author(s)

Partha P. Banerjee, University of DaytonFollow
Jaw-Jueh Liu, University of Alabama, Huntsville

Document Type

Article

Publication Date

8-1993

Publication Source

Journal of the Optical Society of America B

Abstract

Using a perturbational-analysis and Fourier-transform techniques, we solve the Kukhtarev equations to analyze the steady-state and the transient beam fanning in a photorefractive material. Steady-state results are calculated with both thin- and thick-sample models for the photorefractive material, and the results are compared. The thin-sample results are corroborated with a simple physical argument based on an Airy function approach. We find the nature of the dependence of beam fanning on the beam size and sample thickness. Furthermore, we calculate the transient buildup of beam fanning using the thick-sample model.

Inclusive pages

1417-1423

ISBN/ISSN

0030-3941

Comments

Permission documentation is on file.

Copyright

Copyright © 1993, Optical Society of America

Publisher

Optical Society of America

Volume

10

Peer Reviewed

yes

Issue

8

eCommons Citation

Banerjee, Partha P. and Liu, Jaw-Jueh, "Perturbational Analysis of Steady-State and Transient-Beam Fanning in Thin and Thick Photorefractive Media" (1993). Electrical and Computer Engineering Faculty Publications. 162.
https://ecommons.udayton.edu/ece_fac_pub/162