Surface defect detection using structure Lights

Surface defect detection using structure Lights

    Presenter(s)

    Kiranmayee Madhusudhan

    Comments

    3:00-4:15, Kennedy Union Ballroom

    Description

    Three-dimensional imaging based on structured light illumination is used to reconstruct 3D images. The structured light is projected onto the surface of the object to be measured, a camera system captures the object image from a different angle of view. The system uses a digital micro-mirror device (DMD) to generate structured light patterns from projector. The patterns are generated based on digital fringe projection. To quantitatively measure the deformation, the system undergoes calibration using pre-known patterns, during which the relative positions of the object, projector, and camera are determined. The 3D information is then processed using standard Image processing and computer vision algorithms. This approach is significant in delivering high resolution, enables real-time inspections particularly essential for transportation infrastructure applications. With its fast-imaging speed, high resolution, and working distance, the system is well-suited to meet the requirements of real-time, field-based tests for fault detection and material degradation.

    Publication Date

    4-23-2025

    Project Designation

    Graduate Research

    Primary Advisor

    Hui Wang

    Primary Advisor's Department

    Civil and Environmental Engineering and Engineering Mechanics

    Keywords

    Stander Symposium, School of Engineering

    Surface defect detection using structure Lights

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